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Self-Assembled Surface Patterning and Structural Modification upon Femtosecond Laser Processing of Crystalline Silicon

Journal Solid State Phenomena (Volumes 95 - 96)
Volume Gettering and Defect Engineering in Semiconductor Technology X
Edited by H. Richter and M. Kittler
Pages 635-640
DOI 10.4028/www.scientific.net/SSP.95-96.635
Citation Florenta Costache et al., 2003, Solid State Phenomena, 95-96, 635
Authors Florenta Costache, Simona Kouteva-Arguirova, Jürgen Reif
Keywords Crystalline Phase, Femtosecond Laser Processing, Raman Spectroscopy, Self-Assembly of Nanostructures, Silicon, Time-of-Flight Mass Spectroscopy
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