Paper Title:
Properties of TiO2 Films Prepared by the Spray Pyrolysis Method
  Abstract

TiO2 thin films were prepared by spray pyrolysis method. The solution containing titanium(IV)isopropoxide, acetylacetone and ethanol was deposited onto n-type Si(100) and HD Si(100) wafers at substrate temperatures of 315 to 500 0C by pulsed spray solution feed. The films were characterized by FTIR, XRD, AFM, ellipsometry, impedance and I-V measurements. Asdeposited films prepared below 500 0C were amorphous, whereas crystalline films could be achieved at 500 0C. Subsequent annealing at 700 °C in air led to crystalline anatase formation for films deposited below 400 °C. Rutile phase appears in annealed films prepared at a growth temperature above 400 °C. Anatase TiO2 films show refractive index in the range 2.20 to 2.40 and exhibit a relative dielectric constant value of 75 in the range 1 to 100 kHz. Electric breakdown occurs for 120 nm thick film at 250 kV/cm.

  Info
Periodical
Solid State Phenomena (Volumes 99-100)
Edited by
Witold Lojkowski and John R. Blizzard
Pages
259-264
DOI
10.4028/www.scientific.net/SSP.99-100.259
Citation
I. Oja, A. Mere, M. Krunks, C.-H. Solterbeck, M. Es-Souni, "Properties of TiO2 Films Prepared by the Spray Pyrolysis Method", Solid State Phenomena, Vols. 99-100, pp. 259-264, 2004
Online since
July 2004
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$32.00
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