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Intersublevel Relaxation Dependence of Carrier Hopping in Self-Organized InAs Quantum Dot Heterostructures

Journal Solid State Phenomena (Volumes 99 - 100)
Volume Functional Nanomaterials for Optoelectronics and other Applications
Edited by Witold Lojkowski and John R. Blizzard
Pages 41-48
DOI 10.4028/www.scientific.net/SSP.99-100.41
Citation Y.F. Wu et al., 2004, Solid State Phenomena, 99-100, 41
Authors Y.F. Wu, H.T. Shen, Y.H. Lin, C.C. Cheng, R.M. Lin, Tzer En Nee, N.T. Yeh
Keywords Carrier Relaxation Lifetime, InAs Quantum dot, Photoluminescence (PL)
Abstract

The temperature dependence of the photoluminescence (PL) emission spectra of self-organized InAs/GaAs quantum dots (QDs) grown under different growth conditions in the range 20-300K has been investigated. Three InAs QD samples were grown on (100) 2ยบ-tilted toward (111)A Si-doped GaAs substrates by metal-organic chemical vapour epitaxy (MOVPE), with various size uniformities and dot densities. Observing the measured PL spectra at 20K, the differences caused by size uniformities among the three samples were obvious. The PL spectra were simulated with rate equations, taking into account the carrier relaxation between the first excited state and the ground state. Interestingly, the calculated relaxation lifetimes at 20K were 198ps, 139ps and 54ps for the samples. The temperature dependent PL spectra were also simulated using the same model. Based on the calculated values of temperature dependent relaxation lifetimes, the differences in changes with temperature among the three samples are discussed. The results are consistent with the thermal redistribution effect.

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