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SSP - Solid State Phenomena

ISSN: 1662-9779

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• SSP - Editorial Board

• Nanostructured Materials, Thin Films and Hard Coatings for Advanced Applications, Vol. 159
  Edited by: Lilyana Kolakieva and Roumen Kakanakov
• Gettering and Defect Engineering in Semiconductor Technology XIII, Vols. 156 - 158
  Edited by: M. Kittler and H. Richter
• Synthesis, Characterization and Properties of Nanostructures, Vol. 155
  Edited by: Prafulla K. Jha and Arun Pratap
• Smart Materials for Smart Devices and Structures, Vol. 154
  Edited by: Marcin Leonowicz and Dariusz Oleszak
• Magnetism and Magnetic Materials, Vols. 152 - 153
  Edited by: N. Perov
• Nanocomposite Materials, Vol. 151
  Edited by: Erich Kny
• Solid Phase Transformations II, Vol. 150
  Edited by: J. Čermák and I. Stloukal
• Mechatronic Systems and Materials III, Vols. 147 - 149
  Edited by: Zdzislaw Gosiewski and Zbigniew Kulesza
• Ultra Clean Processing of Semiconductor Surfaces IX, Vols. 145 - 146
  Edited by: Paul Mertens, Marc Meuris and Marc Heyns
• Mechatronic Systems and Materials II, Vol. 144
  Edited by: Inga Skiedraite and Jolanta Baskutiene
• Semi-Solid Processing of Alloys and Composites X, Vols. 141 - 143
  Edited by: G. Hirt, A. Rassili, A. Bührig-Polaczek
• Perspectives of nanoscience and nanotechnology, Vol. 140
  Edited by: Witold Łojkowski and John R. Blizzard
• Theory, Modeling and Numerical Simulation, Vol. 139
  Edited by: Veena Tikare, Graeme E. Murch, Frédéric Soisson and Jeung Ku Kang
• Solid Phase Transformations, Vol. 138
  Edited by: J. Čermák and I. Stloukal
• Interaction between Defects and Anelastic Phenomena in Solids , Vol. 137
  Edited by: Igor S. Golovin and Daniil M. Levin
• Advanced Structural and Functional Materials for Protection, Vol. 136
  Edited by: William Lau, Shang Huai Min, Lee Nam Sua, Ma Jan and Alfred Tok
• Nanocomposites and Nanoporous Materials VIII, Vol. 135
  Edited by: Chang Kyu Rhee
• Ultra Clean Processing of Semiconductor Surfaces VIII , Vol. 134
  Edited by: Paul Mertens, Marc Meuris and Marc Heyns
• Gettering and Defect Engineering in Semiconductor Technology XII, Vols. 131 - 133
  Edited by: A. Cavallini, H. Richter, M. Kittler and S. Pizzini
• APPLIED CRYSTALLOGRAPHY XX, Vol. 130
  Edited by: Danuta Stróż & Małgorzata Karolus