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SSP - Solid State Phenomena

ISSN: 1662-9779

• SSP - Home
• SSP - Editorial Board

• Bulk and Graded Nanometals, Vols. 101 - 102
  Edited by: K.J. Kurzydlowski and Z. Pakiela
• Functional Nanomaterials for Optoelectronics and other Applications, Vols. 99 - 100
  Edited by: Witold Lojkowski and John R. Blizzard
• Self-Formation Theory and Applications, Vols. 97 - 98
  Edited by: Stepas Janušonis
• Gettering and Defect Engineering in Semiconductor Technology X, Vols. 95 - 96
  Edited by: H. Richter and M. Kittler
• Interfacial Effects and Novel Properties of Nanomaterials, Vol. 94
  Edited by: Witold Lojkowski and John R. Blizzard
• Polycrystalline Semiconductors VII, Vol. 93
  Edited by: T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner
• Ultra Clean Processing of Silicon Surfaces VI, Vol. 92
  Edited by: Marc Heyns, Paul Mertens and Marc Meuris
• Solid State Chemistry V, Vols. 90 - 91
  Edited by: P. Sajgalík, M. Drábik and S. Varga
• Mechanical Spectroscopy II, Vol. 89
  Edited by: L.B. Magalas
• Impurity Diffusion in Metals, Vol. 88
  Edited by: G. Neumann and C. Tuijn
• Local Lattice Rotations and Disclinations in Microstructures of Distorted Crystalline Materials, Vol. 87
  Edited by: P. Klimanek, A.E. Romanov, B.M. Seefeldt
• Defect Interaction and Clustering in Semiconductors, Vols. 85 - 86
  Edited by: S. Pizzini
• Gettering anf Defect Engineering in Semiconductor Technology IX, Vols. 82 - 84
  Edited by: V. Raineri, F. Priolo, M. Kittler and H. Richter
• Polycrystalline Semiconductors VI, Vols. 80 - 81
  Edited by: O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner
• Beam Injection Assessment of Microstructures in Semiconductors, Vols. 78 - 79
  Edited by: H. Tomokage and T. Sekiguchi
• Ultra Clean Processing of Silicon Surfaces V, Vols. 76 - 77
  Edited by: Marc Heyns, Marc Meuris and Paul Mertens
• Hydrogen Metal Systems II, Vols. 73 - 75
  Edited by: F.A. Lewis and A. Aladjem
• Diffusion and Reactions, Vol. 72
  Edited by: M. Danielewski
• Special Defects in Semiconducting Materials, Vol. 71
  Edited by: R.P. Agarwala
• Gettering and Defect Engineering in Semiconductor Technology VIII, Vols. 69 - 70
  Edited by: H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter