“Solid State Phenomena” specializes in rapid publication of thematically complete volumes from international conference proceedings and complete special topic volumes.
We do not publish stand-alone papers by individual authors.
“Solid State Phenomena” (formerly Part B of “Diffusion and Defect Data” 0377-6883) covers a set of research: fundamentals of the structures and their influence on the properties of solids, of experimental techniques and practical applications of materials, solid-state devices and structures in the context of the latest achievements in the area of research of solid state phenomena.
Authors retain the right to publish an extended and significantly updated version in another periodical.
Indexing: Indexed by Elsevier: SCOPUS www.scopus.com and Ei Compendex (CPX) www.ei.org/. Cambridge Scientific Abstracts (CSA) www.csa.com, Chemical Abstracts (CA) www.cas.org, Google and Google Scholar google.com, ISI (ISTP, CPCI, Web of Science) www.isinet.com, Institution of Electrical Engineers (IEE) www.iee.org, Index Copernicus Journals Master List www.indexcopernicus.com, etc.
Publishing editor: Thomas Wohlbier, TTP USA, email@example.com
Subscription: 14 volumes per year.
In 2015, volumes 217-230 are scheduled to be published.
The subscription rate for web access only is EUR 1099.00 per year,
for web plus print EUR 1486.00 including postage/handling charges.
ISSN print 1012-0394 ISSN cd 1662-9787 ISSN web 1662-9779
(Part B of Diffusion and Defect Data, ISSN 0377-6883)
Editors: Editorial Board
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