Papers by keyword «Schottky Barrier»
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Schottky Barrier Height in Metal-SiC Contact - New Approach to Modelling
Authors: Pavel A. Ivanov, K.I. Ignat'ev
Keywords: Interface Trap, Modelling, Schottky Barrier
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Function an Effect of Additives of Bi-Doped ZnO Ceramics
Authors: S. Tanaka, Naoki Ohashi, Kazuhiko Takahashi
Keywords: Additive, Grain Boundary, Non-Linearity, Schottky Barrier, Varistors, ZnO
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4H-SiC CVD Epitaxial Layers with Improved Structural Quality Grown on SiC Wafers with Reduced Micropipe Density
Authors: Evgenia Kalinina, A.S. Zubrilov, V. Solov'ev, N.I. Kuznetsov, Anders Hallén, Andrey O. Konstantinov, S. Karlsson, S.V. Rendakova, Vladimir Dmitriev
Keywords: Epitaxy, Micropipe, Micropipe Filling Technique, Schottky Barrier
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A UHV Study of Ni/SiC Schottky Barrier and Ohmic Contact Formation
Authors: A. Kestle, S.P. Wilks, P.R. Dunstan, M. Pritchard, G. Pope, A. Koh, P.A. Mawby
Keywords: I-V, Nickel Ni, Ohmic Contacts, Schottky Barrier, X-Ray Photoelectron Spectroscopy (XPS)
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Fermi Level Pinning and Schottky Barrier Characteristics on Reactively Ion Etched 4H-SiC
Authors: B.J. Skromme, E. Luckowski, K. Moore, S. Clemens, D. Resnick, T. Gehoski, D. Ganser
Keywords: Annealing, Barrier Height, Fermi Level Pinning, Ideality, Leakage Current, Nickel Ni, Platinum, Reactive Ion Etching, Schottky Barrier, Titanium
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Chemical Diffusion Across Grain Boundaries: In-Situ Observation and Phenomenological Modeling
Authors: J. Jamnik, M. Leonhardt, Joachim Maier
Keywords: Chemical Diffusion, Grain Boundary, Optical Spectroscopy, Schottky Barrier, SrTiO3
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Passivation of Al/Si Interface by Chemical Treatment: Schottky Barrier Height and Plasma Etch Induced Defects
Authors: Zsolt E. Horváth, M. Ádám, P. Godio, G. Borionetti, I.A. Szabó, E. Gombia, Vo Van Tuyen
Keywords: Chemical Treatment, Interface Modification, Ohmic Contacts, Schottky Barrier, Silicon, Surface Passivation
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Grain Boundary Electron Trap Levels in BaTiO3 Positive Temperature Coefficient Type Ceramics
Authors: B. Huybrechts, Masasuke Takata
Keywords: BaTiO3, Electron Traps, Isothermal Capacitance Transient Spectroscopy ICTS, Positive Temperature Coefficient of Resistivity (PTCR), Schottky Barrier
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Temperature-Dependent Behaviour of Chalcogenide Thin Film Contacts on Porous Silicon
Authors: S. Chakrabarti, S. Dhar
Keywords: Current-Voltage Characteristics, Porous Silicon, Schottky Barrier
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Oxidation-Induced Crystallographic Transformation in Heavily N-Doped 4H-SiC Wafers
Authors: B.J. Skromme, K. Palle, C.D. Poweleit, L.R. Bryant, William M. Vetter, Michael Dudley, K. Moore, T. Gehoski
Keywords: Crystallographic Transformation, Dimpling, Dislocation, Extended Defects, Heavy Doping, Oxidation, Photoluminescence (PL), Raman Scattering, Schottky Barrier, X-Ray Topography
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