Papers by keyword «Silicon» and «Copper (Cu)»
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Structural Studies of Submicron Grained Copper, Germanium and Silicon
Authors: Radomír Kužel, Rinat K. Islamgaliev, František Chmelík
Keywords: Copper (Cu), Germanium, Silicon, Submicron Grained Materials, XRD Line Broadening Analysis
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Copper in Silicon: Quantitative Analysis of Internal and Proximity Gettering
Authors: Scott A. McHugo, T. Heiser, H. Hieslmair, C. Flink, Eicke R. Weber, S.M. Myers, G.A. Petersen
Keywords: Copper (Cu), Gettering, Implantation, Oxygen Precipitates, Silicon, Transient Ion Drift
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A Study of the Copper-Pair Related Centers in Silicon
Authors: Andrei A. Istratov, T. Heiser, H. Hieslmair, C. Flink, Joachim Krüger, Eicke R. Weber
Keywords: Copper (Cu), DLTS, Silicon
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Cu Determination in Silicon Wafers: A Comparison between Electrical and Chemical Measurements
Authors: Vito Raineri, D. Cali, M. Camalleri, M. Di Dio, A. Puglisi
Keywords: AAS, Copper (Cu), Metal Impurity, Silicon, SPV
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Precipitation Kinetics and Recombination Activity of Cu in Si in the Presence of Internal Gettering Sites
Authors: Andrei A. Istratov, R. Sachdeva, C. Flink, S. Balasubramanian, Eicke R. Weber
Keywords: Copper (Cu), Gettering, Minority Carrier Diffusion Length, Silicon
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Copper-Defect and Copper-Impurity Interactions in Silicon
Authors: Stefan K. Estreicher, D. West, P. Ordejón
Keywords: Copper (Cu), Hydrogen, Molecular Dynamics, Silicon
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Ion Beam Induced Excess Vacancies in Si and SiGe and Related Cu Gettering
Authors: R. Kögler, A. Peeva, An. Kuznetsov, J.S. Christensen, B.G. Svensson, Wolfgang Skorupa
Keywords: Cavities, Copper (Cu), Excess Vacancies, Ion Implantation, Rp/2-Gettering, SiGe, Silicon
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Local Dielectric Degradation of Cu-Contaminated SiO2 Thin Films
Authors: Norio Tokuda, Shingo Nishiguchi, Satoshi Yamasaki, Kazushi Miki, Kikuo Yamabe
Keywords: Contamination, Copper (Cu), Dielectric Breakdown, Leakage Current, Silicon, Silicon Dioxide
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The Metastable Si:(S + Cu) Defect
Authors: L. Jeyanathan, Gordon Davies, Edward C. Lightowlers, M. Singh, Hong-Jiang Sun, Bernd Ittermann, Sergei S. Ostapenko, W.A. Barry, P. Mason, G.D. Watkins
Keywords: Copper (Cu), Metastability, ODMR, Silicon, Sulphur, Uniaxial Stress
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Binding of Copper to Nanocavities in Silicon
Authors: S.M. Myers, D.M. Follstaedt, D.M. Bishop
Keywords: Cavities, Copper (Cu), Gettering, Ion Implantation, Silicon
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