HOME CONTACT

Username: Password:

> @scientific.net

Silicon and Strength

Papers by keyword «Silicon» and «Strength» A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens Authors: Kai Duan, Xiao Zhi Hu Keywords: Flaw Size, Silicon, Small-Scale Specimens, Strength, Weibull Distribution Evaluation of Flaw Size Distributions Responsible for Size Effects in Strength of Small-Scale MEMS Specimens Authors: Kai Duan, Xiao Zhi Hu Keywords: MEMS, Silicon, Small-Scale Specimens, Strength, Strength Scatter, Weibull Distribution

Next 10 Keywords SiC (854 entries) Texture (843 entries) Residual Stress (827 entries) Hydroxyapatite (HA) (810 entries) X-Ray Diffraction (XRD) (804 entries) Thin Film (720 entries) Finite Element Method (FEM) (713 entries) Diffusion (702 entries) Transmission Electron Microscopy (TEM) (671 entries) Al Alloy (632 entries)

Total: 1 page; 2 papers 1