Papers by keyword «Structural Defects»
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Are there any Shallow Acceptors in GaN?
Authors: Bo Monemar
Keywords: Acceptor, Localization, Recombination, Structural Defects
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Minority Carrier Diffusion Length in AlGaN: A Combined Electron Beam Induced Current and Transmission Microscopy Study
Authors: A. Cremades, M. Albrecht, Axel Voigt, J. Krinke, R. Dimitrov, Oliver Ambacher, M. Stutzmann
Keywords: AlGaN, Alloys, Diffusion Length, EBIC, Minority Carriers, Si Doping, Structural Defects, Transmission Electron Microscopy (TEM)
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Capacitance Spectroscopy of Deep Centres in SiC
Authors: A.A. Lebedev, N.A. Sobolev
Keywords: Deep Centers, DLTS, Luminescence, SiC, Structural Defects
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Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon
Authors: V.I. Vdovin, N.A. Sobolev, E.M. Emelyanov, O.B. Gusev, E.I. Shek, T.G. Yugova
Keywords: Erbium Implantation, Photoluminescence (PL), Silicon, Structural Defects
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Silicon Impurity-Related Effects on Structural Defects in III-V Nitrides
Authors: N. Shmidt, V. Busov, Valentin V. Emtsev, R. Kyutt, W. Lundin, D.S. Poloskin, V.V. Ratnikov, A.V. Sakharov, A. Usikov
Keywords: AlGaN, Epilayer, Galium Nitride (GaN), Micropipe, Mobility, MOCVD, Nanopipes, Silicon, Structural Defects
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Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er
Authors: N.A. Sobolev, A.M. Emel'yanov, Yu.A. Kudryavtsev, R.N. Kyutt, M.I. Makovijchuk, Yu.A. Nikolaev, E.O. Parshin, V.I. Sakharov, I.T. Serenkov, E.I. Shek, K.F. Shtel'makh
Keywords: Annealing, Erbium, Implantation, Photoluminescence (PL), Silicon, Structural Defects
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Minority Carrier Diffusion Lengths in Silicon Doped Gallium Nitride Thin Films Measured by Electron Beam Induced Current
Authors: C. Grazzi, M. Albrecht, Horst P. Strunk, Z. Bougrioua, I. Moerman
Keywords: EBIC, Galium Nitride (GaN), Minority Carrier Diffusion Length, Si Doping, Structural Defects, Transmission Electron Microscopy (TEM)
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Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography
Authors: Etienne Pernot, E. Neyret, Cécile Moulin, Petra Pernot-Rejmánková, Francois Templier, Lea Di Cioccio, Thierry Billon, Roland Madar
Keywords: Schottky Diode, Structural Defects, Synchrotron Topography
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Structural Defects in Electrically Degraded 4H-SiC PiN Diodes
Authors: P.O.Å. Persson, J.M. Molina-Aldareguia, Henrik Jacobsson, J.Peder Bergman, T.O. Tuomi, W.J. Clegg, Erik Janzén, L. Hultman
Keywords: Electron Microscopy, Stacking Fault, Structural Defects, Synchrotron Topography
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Some Comparative Properties of Diffusion-Welded Contacts to 6H and 4H Silicon Carbide
Authors: Oleg Korolkov, T. Rang
Keywords: Diffusion Welding, Schottky Contacts, SiC Substrates, Specific Contact Resistance, Structural Defects
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