Papers by keyword «Texture»
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A New Method for High Accuracy QPA on Highly Textured Samples
Authors: D. Reefman
Keywords: Full Pattern, QPA, Quantitative Phase Analysis QPA, Texture
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Implications of Texture on Powder Diffraction - Three-Dimensional Powder Diffraction -
Authors: Hans Joachim Bunge
Keywords: Crystallites, Indexing Criterion, Multicrystals, Orientation Dependent Lattice Distortion, Peak Broadening Pole Figures, Peak Shift Pole Figures, Polycrystals, Separation, Statistical Fluctuation, Superposed Structure Factors, Texture, Three-Dimensional Powder Diffraction
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Mapping in Real and Reciprocal Space
Authors: Thomas Wroblewski, D. Breuer, H.A. Crostack, F. Fandrich, M. Gross, P. Klimanek
Keywords: Imaging, Reciprocal Space Mapping (RSM), Strain, Texture
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New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
Authors: Maurizio Ferrari, Luca Lutterotti, Siegfried Matthies, P. Polonioli, H.R. Wenk
Keywords: Elastic Modulus, ODF Calculation, Residual Stress, Rietveld Method, Texture, WIMV
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A Fully Automated High-Temperature Powder Diffractometer
Authors: A. Kern, W. Eysel
Keywords: Full Automation, High-Temperature Powder Diffractometry, Phase Transition, Temperature Calibration, Texture
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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Neutron Diffraction Applied to the Study of Microstructure and Texture of Industrial Magnetic Alnico Material
Authors: A. Alker, E. Jansen, Wolfgang Schäfer, A. Kirfel, D. Seitz, M. Grönefeld
Keywords: Alnico, Microstructure, Neutron Diffraction, Pole Figure, Quasicrystal, Texture
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Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon
Authors: S. Geier, R. Hessmer, M. Schreck, B. Stritzker, B. Rauschenbach, Kurt Helming, Karsten Kunze, W. Erfurth
Keywords: CVD Diamond, Epitaxy, Growth, Texture, Thin Film
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On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings
Authors: I. Handreg, P. Klimanek, G. Lanza, M. Schneider
Keywords: Atomic Force Microscope (AFM), Cu-Coatings, Electrodeposition, Epitaxy, Microstructure, Nucleation, Texture, X-Ray Diffraction (XRD)
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Variation of Preferred Orientation of Erbium Thin Films with Temperature and Substrate
Authors: G.R.G. Craib, M.A. Player, M.J. Rodman, C.C. Tang
Keywords: Erbium, Texture, Thin Film Materials
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