Papers by keyword «Texture» and «Residual Stress»
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New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
Authors: Maurizio Ferrari, Luca Lutterotti, Siegfried Matthies, P. Polonioli, H.R. Wenk
Keywords: Elastic Modulus, ODF Calculation, Residual Stress, Rietveld Method, Texture, WIMV
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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Residual Stress of Monoclinic Zircon Obtained by X-Ray Diffraction in ZY4 Oxidized Cladding Tubes
Authors: Th. Jacquot, Ronald Guillén, Manuel François, B. Bourniquel, J. Senevat
Keywords: Residual Stress, Texture, Tube, X-Ray Diffraction (XRD), Zircaloy 4, Zircon
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Treatment of Elastic and Plastic Anisotropy of Polycrystalline Materials with Texture
Authors: Paul Van Houtte
Keywords: Effective Moduli, Elastic Constants, Harmonic Method, Plastic Anisotropy, Residual Stress, R-Value, Texture, Yield Locus
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Construction of the New Material Science Neutron Diffractometer STRESS-SPEC
Authors: H.M. Mayer, A.R. Pyzalla, Walter Reimers
Keywords: Diffractometer, Neutron Scattering, Reactor FRM ll, Residual Stress, Texture
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A Comparison of Neutron and High Energy Synchrotron Radiation as Tools for Texture and Stress Analysis
Authors: A.R. Pyzalla, Walter Reimers, K.D. Liss
Keywords: Neutron Diffraction, Residual Stress, Stress Gradients, Synchrotron Radiation, Texture
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Residual Stresses in Polycrystalline Thin Films
Authors: Paolo Scardi, Yu Hui Dong
Keywords: Residual Stress, Stress Gradients, Texture, Thin Film, X-Ray Elastic Constants
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Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
Authors: Matteo Leoni, Yu Hui Dong, Paolo Scardi
Keywords: PVD, Residual Stress, Texture, Thin Film, Zirconia
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Diffraction Techniques in Engineering Applications
Authors: Kris J. Kozaczek, C.R. Hubbard, T.R. Watkins, Xiao Lin Wang, S. Spooner
Keywords: Neutron Diffraction, Residual Stress, Strain, Texture, X-Ray Diffraction (XRD)
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Stress and Texture Analysis with Two-Dimensional X-Ray Diffraction
Authors: Bob B. He, Uwe Preckwinkel, Kingsley L. Smith
Keywords: 2D Detector, Area Detector, Residual Stress, Texture, Two-Dimensional X-Ray Diffraction
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