Papers by keyword «Thin Film»
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A Computer Program for Structural Refinement from Thin Film XRD Patterns
Authors: Matteo Leoni, Paolo Scardi
Keywords: Structure Refinement, Thin Film, Whole-Powder-Pattern Fitting
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Applications of a Thin Film Diffractometer
Authors: P. Van der Sluis
Keywords: Instrumentation, Thin Film
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Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry
Authors: J. Klimke, Harm Wulff
Keywords: Grazing Incidence Diffractometry, Non-Homogeneous Layer, Reflectometry, Thin Film, Titanium Nitride TiN
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Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
Authors: K. Fischer, H. Oettel
Keywords: Arc Evaporation, Electrical Contact, Hard Coating, Magnetron Sputtering, Residual Stress, SEEMANN-BOHLIN-Focusing, Thin Film, Titanium Nitride, X-Ray Diffraction (XRD)
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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High Temperature Grazing Incidence Studies on Aluminium Films
Authors: J. Klimke, L. Fischer, Harm Wulff
Keywords: Aluminium, High Temperature, In Situ Grazing Incidence, In Situ Grazing Incidence X-Ray Reflectometry GIXR, Thin Film
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Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)
Authors: A. Skokan, P. von Blanckenhagen, E. Quandt, M. Walter
Keywords: Magnetostriction, Nanomaterial, Particle Size Analysis, Rietveld Refinement, Size-Strain Analysis, Thin Film
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Effects of Oxygen Stoichiometry on the Structural Properties of W-Ti-O Thin Films
Authors: L. Sangaletti, L.E. Depero, B. Allieri, S. Groppelli, G. Sberveglieri
Keywords: Disorder Effects, Gas Sensor, Micro Raman, Thin Film, W-Ti-O, X-Ray Diffraction (XRD)
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X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition
Authors: J. Bassas, X. Alcobé, M. Doudkowsky, J. Santiso, S. Berton, A. Figueras
Keywords: Ba-Incorporation, MOCVD, Off-Stoichiometric Composition, Thin Film, YBCO
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Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon
Authors: S. Geier, R. Hessmer, M. Schreck, B. Stritzker, B. Rauschenbach, Kurt Helming, Karsten Kunze, W. Erfurth
Keywords: CVD Diamond, Epitaxy, Growth, Texture, Thin Film
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