Papers by keyword «Thin Film» and «Texture»
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon
Authors: S. Geier, R. Hessmer, M. Schreck, B. Stritzker, B. Rauschenbach, Kurt Helming, Karsten Kunze, W. Erfurth
Keywords: CVD Diamond, Epitaxy, Growth, Texture, Thin Film
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Texture Analysis of the YBCO Thin Films Reveals Twinning in the YBCO Crystallites
Authors: D. Machajdík, K. Fröhlich, F. Weiss, A.P. Kobzev
Keywords: Texture, Thin Film, Twinning, YBCO
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Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
Authors: I. Tomov
Keywords: Extinction, Pole Density, Texture, Thickness, Thin Film, X-Ray Diffraction (XRD)
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Residual Stresses in Polycrystalline Thin Films
Authors: Paolo Scardi, Yu Hui Dong
Keywords: Residual Stress, Stress Gradients, Texture, Thin Film, X-Ray Elastic Constants
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X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving Solution
Authors: Christoph Genzel, Walter Reimers
Keywords: Residual Stress Gradients, Surface Processing, Texture, Thin Film
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Texture and Secondary Extinction of Vacuum Deposited Ag Films
Authors: I. Tomov, M. Adamik, P.B. Barna
Keywords: Secondary Extinction, Silver, Texture, Thin Film, Volume Fraction
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Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
Authors: Matteo Leoni, Yu Hui Dong, Paolo Scardi
Keywords: PVD, Residual Stress, Texture, Thin Film, Zirconia
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Application of the Monte Carlo Method to Fiber Texture of Electrolytically Deposited Ni Films
Authors: T. Fuller, K. Krezhov, I. Tomov, P. Konstantinov
Keywords: Monte Carlo, Texture, Thin Film
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X-Ray Diffraction Characterization of Thin Superconductive Films
Authors: Kris J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter
Keywords: High Tc Superconductors, Texture, Thin Film, X-Ray Diffraction (XRD)
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