Papers by keyword «Thin Film» and «Transmission Electron Microscopy (TEM)»
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Growth of High Quality AIN Epitaxial Films by Hot-Wall Chemical Vapour Deposition
Authors: Urban Forsberg, J. Birch, Mike F. MacMillan, P.O.Å. Persson, L. Hultman, Erik Janzén
Keywords: Hot-Wall CVD, Infrared Reflectance, Thin Film, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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Metastable Phase Formation in Fe-Al Thin Films Cocondensed by Cross-Beam Pulsed Laser Deposition
Authors: H. Geisler, A. Mensch, A. Tselev, A. Gorbunov, H. Worch
Keywords: Amorphous Fe-Al, Cross-Beam PLD, Crystallization, Phase Stability, Thin Film, Transmission Electron Microscopy (TEM)
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Silicide Islands Formation during Interface Reactions of Thin Films of Metallic Glasses with Si Substrates
Authors: N.V. Rozhanskii, V.O. Lifshits
Keywords: Metallic Glasses, Silicides, Thin Film, Transmission Electron Microscopy (TEM)
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TiN Thin Films Preparation, Structural and Electrical Proberties
Authors: A. Tarniowy, R. Mania, M. Rekas
Keywords: AES, Electrical Conductivity, Thin Film, Titanium Nitride, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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Oriented Growth of ZnO Thin Films on SiC Buffered Si(001) Substrates by Pulsed Laser Deposition
Authors: Chang Jun Yoo, Yeon A Shim, Jong Ha Moon, Sang Sub Kim, Byung Teak Lee, Jin Hyeok Kim
Keywords: Interfacial Structure, Oriented Growth, PLD, Thin Film, Transmission Electron Microscopy (TEM), ZnO
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Stress-Induced Grain Growth in Thin Al-1%Si Layers on Si/SiO2 Substrates
Authors: D. Gerth, Stefan Zaefferer, Robert A. Schwarzer
Keywords: Al-1%Si, Electron Diffraction, Grain Growth, Kikuchi Patterns, Local Texture, Strain, Stress, Thin Film, Transmission Electron Microscopy (TEM)
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Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations
Authors: D. Gerth, Robert A. Schwarzer
Keywords: Al-1%Si, Electron Diffraction, Grain Growth, Kikuchi Patterns, Local Texture, Strain, Stress, Thin Film, Transmission Electron Microscopy (TEM)
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The Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates
Authors: D. Gerth, Robert A. Schwarzer
Keywords: Al-Films, Conductor Layers, Grain Boundary, Grain Growth, Local Texture, Stress, Thin Film, Transmission Electron Microscopy (TEM)
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The Effect of Grain-Specific Texture on Hillock Growth in Al-1%Si Films on SiO2/Si Substrates
Authors: D. Gerth, Robert A. Schwarzer
Keywords: Al Films, Conductor Layers, Grain Boundary, Hillock Growth, Local Texture, Thin Film, Transmission Electron Microscopy (TEM)
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Texture Studies on Borocarbide Thin Films
Authors: K. Subba Rao, R. Tamm, S.C. Wimbush, G.H. Cao, C.-G. Oertel, Werner Skrotzki, B. Holzapfel
Keywords: Borocarbides, Superconductivity, Texture, Thin Film, Transmission Electron Microscopy (TEM)
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