Papers by keyword «Thin Film» and «X-Ray Diffraction (XRD)»
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Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
Authors: K. Fischer, H. Oettel
Keywords: Arc Evaporation, Electrical Contacts, Hard Coating, Magnetron-Sputtering, Residual Stress, SEEMANN-BOHLIN-Focusing, Thin Film, Titanium Nitride, X-Ray Diffraction (XRD)
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Effects of Oxygen Stoichiometry on the Structural Properties of W-Ti-O Thin Films
Authors: L. Sangaletti, L.E. Depero, B. Allieri, S. Groppelli, G. Sberveglieri
Keywords: Disorder Effects, Gas Sensors, Micro Raman, Thin Film, W-Ti-O, X-Ray Diffraction (XRD)
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Residual Stress in Diamond Coatings by Synchrotron Radiation XRD
Authors: Paolo Scardi, Matteo Leoni, V. Sessa, M.L. Terranova, G. Cappuccio
Keywords: Diamond, Hot Filament Chemical Vapor Deposition (HFCVD), Residual Stress, Synchrotron Radiation, Thin Film, X-Ray Diffraction (XRD)
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Growth of High Quality AIN Epitaxial Films by Hot-Wall Chemical Vapour Deposition
Authors: Urban Forsberg, J. Birch, Mike F. MacMillan, P.O.Å. Persson, L. Hultman, Erik Janzén
Keywords: Hot-Wall CVD, Infrared Reflectance, Thin Film, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN/6H-SiC(0001) Thin Films
Authors: Sukkaneste Tungasmita, J. Birch, L. Hultman, Erik Janzén, J.-E. Sundgren
Keywords: 6H-SiC, AlN, High Resolution Transmission Electron Microscopy (HRTEM), SIMS, Sputtering, Thin Film, X-Ray Diffraction (XRD)
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Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
Authors: I. Tomov
Keywords: Extinction, Pole Density, Texture, Thickness, Thin Film, X-Ray Diffraction (XRD)
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Stress in Thin Layers; Grain Interaction, Elastic Constants and Diffraction Response
Authors: Jan-Dirk Kamminga, Matteo Leoni, U. Welzel, P. Lamparter, Eric J. Mittemeijer
Keywords: Elastic Constants, Stress, Thin Film, X-Ray Diffraction (XRD)
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Internal Stresses in Aluminium Interconnects
Authors: A. Saerens, Paul Van Houtte, A. Witvrouw
Keywords: Finite Element Modeling, Microelectronics, Thermal Stress, Thin Film, X-Ray Diffraction (XRD)
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Stress in Poly-SiC Films Grown by Low Pressure CVD
Authors: J. Rodríguez-Viejo, E. Hurtós, R. Kressmann, Maria T. Clavaguera-Mora
Keywords: Chemical Vapor Deposition (CVD), Poly-SiC, Stress, Thin Film, X-Ray Diffraction (XRD)
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Phase Coexistence at MPB in PZT Thin Films prepared by Sol-Gel Processing
Authors: F. Vasiliu, C. Parlog, C. Cobianu, A. Ianculescu, V. Ontalus
Keywords: Crystallization, PZT, Sol-Gel Processing, Thin Film, X-Ray Diffraction (XRD)
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