Papers by keyword «Transmission Electron Microscopy (TEM)»
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APFIM Studies of Nanocomposite Soft and Hard Magnetic Materials
Authors: Kazuhiro Hono, De Hai Ping
Keywords: 3 DAP, APFIM, Atom Probe, Exchange Spring Magnet, Fe-Si-B, Nanocomposite Magnet, Nanocrystal, Nd-Fe-B, Soft Magnetic Materials, Three Dimensional Atom Probe, Transmission Electron Microscopy (TEM)
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Alloying Reaction between Nanometer-Sized Indium and Gold Particles at Reduced Temperatures
Authors: Hiroyuki Y. Yasuda, H. Mori
Keywords: Alloying Reaction, Nanometer-Sized Particle, Phase Equilibrium, Transmission Electron Microscopy (TEM)
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Microstructure, Conductivity and Hardness of Cu and Ag-Based Compacts with Immiscible Elements
Authors: K. Tousimi, Alain Reza Yavari, Jung Ho Ahn, Andre Sulpice
Keywords: Ag Matrix Composites, Ball Milling, Cu Matrix Composites, Electrical Resistivity, Scanning Electron Microscope (SEM), Strengthening Dispersion, Transmission Electron Microscopy (TEM), Vickers Hardness, X-Ray Diffraction (XRD)
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Identification of Primary Crystals in ZrTiCuNiBe Metallic Bulk Glasses
Authors: N. Wanderka, Q. Wei, Irina Sieber, U. Czubayko, M.P. Macht
Keywords: Bulk Metallic Glass, Field Ion Microscopy with Atom Probe, Primary Crystals, Transmission Electron Microscopy (TEM)
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Microstructural Study of Nanocrystalline CeO2 by X-Ray Powder Diffraction and High Resolution Transmission Electron Microscopy
Authors: N. Guillou, Liviu Nistor, Hartmut Fuess, Horst Hahn
Keywords: Inert Gas Condensation, Microstructure, Nanocrystalline Ceria, Transmission Electron Microscopy (TEM), X-Ray Powder Diffraction
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Grain Size Analysis in Electrodeposited Cu-Coatings
Authors: S. Schläfer, P. Klimanek, I. Handreg, G. Heinzel, G. Lanza
Keywords: Electrolytic Cu-Coatings, Grain Size Analysis, Scanning Electron Microscope (SEM), Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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Planar 6H-SiC p-n Junctions Prepared by Selective Epitaxial Growth
Authors: Kai Christiansen, T. Dalibor, Reinhard Helbig, S. Christiansen, Horst P. Strunk
Keywords: Chemical Vapor Deposition, Planar p-n Junction, Selective Epitaxial Growth, Transmission Electron Microscopy (TEM)
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Growth and Characterization of SiC Films on Large-Area Si Wafers by APCVD - Temperature Dependence
Authors: Chien-Hung Wu, A.J. Fleischman, Christian A. Zorman, M. Mehregany
Keywords: APCVD, Temperature Dependence, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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Improved Epitaxy of Cubic SiC Thin Films on Si(111) by Solid-Source MBE
Authors: Andreas Fissel, K. Pfennighaus, Ute Kaiser, J. Kräußlich, H. Hobert, B. Schröter, W. Richter
Keywords: Heteroepitaxy, IR, LEED, MBE, Raman, RHEED, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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The Origin of Triangular Surface Defects in 4H-SiC CVD Epilayers
Authors: W.L. Zhou, P. Pirouz, J. Anthony Powell
Keywords: Dislocation, Epitaxy, Polytypism, Surface Defects, Transmission Electron Microscopy (TEM)
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