Papers by keyword «Transmission Electron Microscopy (TEM)»
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Key Microstructural Changes during High Strain Rate Superplastic Deformaion of an Al-Zn-Mg-Cu-Zr Alloy Containing Sc
Authors: A.K. Mukhopadhyay, A. Kumar, K.S. Prasad, S. Raveendra, Indradev Samajdar
Keywords: Al Alloy AA7010, Recrystallization, Sc Addition, Superplasticity, Texture, Transmission Electron Microscopy (TEM)
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Structural Characterization of Graphene Grown by Thermal Decomposition of Off-Axis 4H-SiC (0001)
Authors: Filippo Giannazzo, Martin Rambach, Wielfried Lerch, Corrado Bongiorno, Salvatore Di Franco, Emanuele Rimini, Vito Raineri
Keywords: Atomic Force Microscopy, Graphene, Silicon Carbide (SiC), Transmission Electron Microscopy (TEM)
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Surface Corrugation and Stacking Misorientation in Multilayers of Graphene on Nickel
Authors: Vito Raineri, Corrado Bongiorno, Salvatore Di Franco, Raffaella Lo Nigro, Emanuele Rimini, Filippo Giannazzo
Keywords: Atomic Force Microscopy, Graphene, Nickel, Transmission Electron Microscopy (TEM)
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Mechanisms of Dislocation Network Formation in Si(001) Hydrophilic Bonded Wafers
Authors: Vladimir Vdovin, Oleg Vyvenko, Evgenii Ubyivovk, Oleg Kononchuk
Keywords: Dislocation Reactions, Screw Dislocations, Silicon Wafer Bonding, Transmission Electron Microscopy (TEM)
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Identification of Phases in Alloy Steels after Quenching and after Isothermal Quenching
Authors: Julita Smalc-Koziorowska, Elżbieta Jezierska, Wiesław Świątnicki
Keywords: Quenching, Steel Microstructure, Transmission Electron Microscopy (TEM)
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Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy
Authors: Marek Wzorek, Andrzej Czerwiński, Andrian V. Kuchuk, Jacek Ratajczak, Ania Piotrowska, Jerzy Kątcki
Keywords: Kirkendall Effect, Nickel Ni, Ohmic Contact, Silicon Carbide (SiC), Transmission Electron Microscopy (TEM), Void
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Characterization of Triangular-Defects in 4° off 4H-SiC Epitaxial Wafers by Synchrotron X-Ray Topography and by Transmission Electron Microscopy
Authors: Tamotsu Yamashita, Kenji Momose, Daisuke Muto, Yoshiki Shimodaira, Kuniaki Yamatake, Yoshihiko Miyasaka, Takayuki Sato, Hirofumi Matsuhata, Makoto Kitabatake
Keywords: Dislocation, Silicon Carbide (SiC), Synchrotron X-Ray Topography, Transmission Electron Microscopy (TEM), Triangular-Defect
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Transmission Electron Microscopy Investigations of Metal-Impurity-Related Defects in Crystalline Silicon
Authors: Michael Seibt, Philipp Saring, Philipp Hahne, Linda Stolze, M.A. Falkenberg, Carsten Rudolf, Doaa Abdelbarey, Henning Schuhmann
Keywords: EBIC/FIB, Extended Defects, Photovoltaic (PV), Silicon, Transmission Electron Microscopy (TEM)
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Cross-Sectional TEM Characterization of Re-Based Diffusion Barrier on Nb Substrate
Authors: S. Eni, Y. Wang, N. Hashimoto, Somei Ohnuki, Toshio Narita
Keywords: Cross-Sectional Structure, Diffusion Barrier Layer, Niobium, Transmission Electron Microscopy (TEM)
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TEM Study of Ni-Mn-Co-In Ferromagnetic Shape Memory Alloys
Authors: Krystian Prusik, Katarzyna Bałdys, Danuta Stróż
Keywords: Martensitic Structure, Ni-Mn-Co-in Ferromagnetic Shape Memory Alloys (FSMA), Transmission Electron Microscopy (TEM)
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