Papers by keyword «X-Ray Diffraction (XRD)» and «Annealing»
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AlN Deposition by OMVPE and PLD Used as an Encapsulate for Ion Implanted SiC
Authors: Kenneth A. Jones, K. Xie, D.W. Eckart, M.C. Wood, V. Talyansky, R.D. Vispute, T. Venkatesan, K. Wongchotigul, Michael G. Spencer
Keywords: AES, Annealing, Encapsulate, OMVPE, PLD, X-Ray Diffraction (XRD)
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Effects of Al-C Ion-Implantation and Annealing in Epitaxial 6H-SiC Studied by Structural and Optical Techniques
Authors: Zhe Chuan Feng, Ian T. Ferguson, R.A. Stall, K. Li, Y. Shi, H. Singh, Kiyoshi Tone, Jian H. Zhao, A.T.S. Wee, K.L. Tan, F. Adar, B. Lenain
Keywords: 6H-SiC, Annealing, FTIR, Ion Implantation, Raman Scattering, SIMS, X-Ray Diffraction (XRD)
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Phase Formation Sequence of Nickel Silicides from Rapid Thermal Annealing of Ni on 4H-SiC
Authors: Lynnette D. Madsen, Erik B. Svedberg, H.H. Radamson, Christer Hallin, B. Hjörvarsson, C. Cabral, J.L. Jordan-Sweet, C. Lavoie
Keywords: Annealing, Atomic Force Microscopy (AFM), Contact Resistivity, Metallization, Nickel Ni, RBS, RTA, Surface Morphology, Synchrotron, X-Ray Diffraction (XRD)
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Thermal Annealing Effect on TiN/Ti Layers on 4H-SiC: Metal-Semiconductor Interface Characterization
Authors: D. Defives, O. Durand, F. Wyczisk, J. Olivier, Olivier Noblanc, C. Brylinski
Keywords: AES, Annealing, Interfacial Layer, Metal/SiC, Reflectivity, Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD)
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The Recovery and Recrystallisation of a Mechanically Alloyed ODS-Fe3Al Alloy
Authors: Justin Ritherdon, A.R. Jones, Ian G. Wright
Keywords: Annealing, Channelling Contrast, Defect, Degassing, Mechanical Alloying, Residual Strains, Transmission Electron Microscopy (TEM), Vickers Hardness, X-Ray Diffraction (XRD)
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Residual Stress Evolution by the ex-situ Annealing of TiN Thin Films Deposited on Steel Substrates
Authors: M. Ye, G. Berton, J-.L. Delplancke, M.-P. Delplancke, Luc Segers, R. Winand, K. De Bruyn
Keywords: Annealing, Atomic Force Microscopy (AFM), Residual Stress, Surface Morphology, TiN Films, X-Ray Diffraction (XRD)
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Structural Relaxation in the Metallic Glass Fe78Si9B13
Authors: J. Filipecki
Keywords: Annealing, Metallic Glasses, Structural Relaxation, X-Ray Diffraction (XRD)
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