Papers by keyword «X-Ray Diffraction (XRD)» and «Grain Boundary»
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Future Trends: Texture Analysis for Structure-Sensitive Properties
Authors: Brent L. Adams, Dorte Juul Jensen, Henning Friis Poulsen, R.M. Suter
Keywords: Grain Boundary, Microstructure, Residual Strains, Structure-Sensitive Properties, X-Ray Diffraction (XRD)
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Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction
Authors: Robert A. Schwarzer
Keywords: BKD, Crystal Texture, Electron Backscattered Pattern (EBSP), Grain Boundary, Kikuchi Patterns, Pole Figure, Resiudal Stresses, X-Ray Diffraction (XRD), X-Ray Fluorescence Analysis
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