Papers by keyword «X-Ray Photoelectron Spectroscopy (XPS)»
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Study of Initial Stage of SiC Growth on Si(100) Surface by XPS, RHEED and SEM
Authors: T. Takaoka, Haruo Saito, Y. Igari, I. Kusunoki
Keywords: C2H4, Growth Mechanism, RHEED, Scanning Electron Microscope (SEM), X-Ray Photoelectron Spectroscopy (XPS)
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Role of Fast Diffusion Paths in the Initial Stages of Oxidation of High Temperature Chromium-Steels
Authors: Zs. Tôkei, H. Viefhaus, K. Hennesen, Hans Jürgen Grabke
Keywords: 9-20 wt% Cr-Steels, AES, AES Depth Profile, Diffusion, Oxidation, X-Ray Photoelectron Spectroscopy (XPS)
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XPS Determination of Diffusion Coefficients of Cations in Thin Passive Films on Alloys
Authors: Katsuhiko Asami, Eiji Akiyama, Koji Hashimoto
Keywords: Al Alloy, Diffusion Coefficient, Mobility, Passive Film, X-Ray Photoelectron Spectroscopy (XPS)
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Physical and Electrical Characterization of WN Schottky Contacts on 4H-SiC
Authors: Olivier Noblanc, C. Arnodof, S. Cassette, C. Brylinski, A. Kakanakova-Georgieva, Ts. Marinova, Liliana Kassamakova, R. Kabanakov, Béla Pécz, A. Sulyok, György Z. Radnóczi
Keywords: Schottky Rectifiers, Transmission Electron Microscopy (TEM), WN, X-Ray Photoelectron Spectroscopy (XPS)
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6H-SiC MOS Capacitors on Sloped Surfaces: Realisation, Characterisation and Electrical Results
Authors: Frédéric Lanois, Dominique Planson, P. Lassagne, Christophe Raynaud, Edwige Bano
Keywords: Atomic Force Microscopy (AFM), Capacitance Measurements, MOS Capacitors, Plasma Etching, Trench Structure, X-Ray Photoelectron Spectroscopy (XPS)
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Formation of Magnesium Oxide Thin Films by Reactive Sputtering
Authors: K. Irie, Shoji Ishibashi, Toshiyuki Nishimura, Hidetoshi Fujii, S. Muraji, Y. Shima, H. Hasuyama
Keywords: Fast Atom Beam, MgO, PDP, Reactive Sputtering, X-Ray Photoelectron Spectroscopy (XPS)
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A Molecular Orbital Study on the Formation of Hetero-Metalloxane Bonds under Mechanical Stressing
Authors: Y. Fujiwara, Tetsuhiko Isobe, Mamoru Senna, Junzo Tanaka
Keywords: Bond Order, Calcium, Chemical Shift, Coordination Number, Mechanochemistry, Molecular Orbital Calculations, Silica, Silicate, X-Ray Photoelectron Spectroscopy (XPS), Xα Method
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XPS Analysis of SiO2/SiC Interface Annealed in Nitric Oxide Ambient
Authors: H.-F. Li, Sima Dimitrijev, D. Sweatman, H.B. Harrison
Keywords: Interface, Nitridation, Oxide, X-Ray Photoelectron Spectroscopy (XPS)
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A Surface/Interfacial Structural Model of Pd Ultra-thin Film on SiC at Elevated Temperatures
Authors: Wei Jie Lu, D.T. Shi, T.R. Crenshaw, A. Burger, W.E. Collins
Keywords: Atomic Force Microscopy, Interfacial Structures, Pd, Surface Structure, X-Ray Photoelectron Spectroscopy (XPS)
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Low Resistance Ohmic Contacts to n-SiC Using Niobium
Authors: T.N. Oder, John R. Williams, K.W. Bryant, M.J. Bozack, John Crofton
Keywords: Niobium, 'non-reacted' Ohmic Contact, RBS, Specific Contact Resistance, X-Ray Photoelectron Spectroscopy (XPS)
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