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Articles by author: A. Cornet

• Analysis of the Electric Field Influence on the Emission Rate of the Te-Related Center in GaAs_0.6P_0.4
  Published in: Defects in Semiconductors 14 (p533)
• Comparison between AS-Grown and Annealed Quantum Dots Morphology
  Published in: Defects in Semiconductors 19 (p1689)
• Composition Modulation Effects on the Generation of Defects in In_0.54Ga_0.46As Strained Layers
  Published in: Defects in Semiconductors 16 (p1285)
• Defects Analysis in Strained InAlAs and InGaAs Films Grown on (111)B InP Substrates
  Published in: Defects in Semiconductors 19 (p1211)
• High Temperature Oxidation of Iron in its Initial Phase Studied by Grazing X-Ray Reflectometry
  Published in: European Powder Diffraction 6 (p768)
• Influence of the Cobalt on the Electroluminescence Spectra of ZnO
  Published in: Defects in Semiconductors 15 (p567)
• Laser Surface Treatments of Tool Steels
  Published in: Surface Engineering with High Energy Beams (p245)
• Multi-Methods Characterization of Nitrogen Implanted Titanium
  Published in: Surface Engineering with High Energy Beams (p547)
• Optical Isothermal Transient Spectroscopy: Application to the Boron Implantation in GaAs
  Published in: Defects in Semiconductors 14 (p539)
• Relations between Thermal Calculation and Metallurgical Transformations during the Laser Surface Hardening Treatment in Plain Carbon Steel and S.G. Cast Iron
  Published in: Surface Engineering with High Energy Beams (p189)
• Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data
  Published in: European Powder Diffraction 5 (p170)