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Papers by Author: A. Kumar

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An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Authors: A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric Jan Mittemeijer

Abstract: A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

Diffraction Stress Analysis Using Direction Dependent Grain-Interaction Models

Authors: U. Welzel, Sylvain Fréour, A. Kumar, Eric Jan Mittemeijer

Reconstruction of Cleaved 6H-SiC Surfaces

Authors: Ulrich Starke, M. Tallarida, A. Kumar, K.M. Horn, O. Seifarth, L. Kipp

391

High Current Pulsed Positron Microprobe

Authors: Richard H. Howell, W. Stoeffl, A. Kumar, P.A. Sterne, T.E. Cowan, J. Hartley

644

Nonisothermal Crystallization of Se₇₀Te₂₆Sb₄ Glass

Authors: P. Predeep, N.S. Saxena, M.P. Saksena, A. Kumar

Arsenic-Antisite-Related Defects in GaAs Grown at Low Temperature: Charaterization of Localized States

Authors: J.I. Landman, C.G. Morgan, J.T. Schick, A. Kumar, P. Papoulias, M.F. Kramer

249

Ionic Conduction in Composite Solid Electrolytes PbX₂ (X = Cl, Br, I) : Al₂O₃ and MCI (M = Na, K, Rb, Cs) : Al₂O₃ Systems

Authors: A. Kumar