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Articles by author: Anton J. Bauer

• Influence of the Oxidation Temperature and Atmosphere on the Reliability of Thick Gate Oxides on the 4H-SiC C(000-1) Face
  Published in: Silicon Carbide and Related Materials 2007 (p597)
• Investigation of Rapid Thermal Annealed pn-Junctions in SiC
  Published in: Silicon Carbide and Related Materials 2003 (p1073)
• Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals
  Published in: Silicon Carbide and Related Materials 2000 (p319)
• NMOS Logic Circuits Using 4H-SiC MOSFETs for High Temperature Applications
  Published in: Silicon Carbide and Related Materials 2009 (p1143)
• Surface Properties and Electrical Characteristics of Rapid Thermal Annealed 4H-SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p609)