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Articles by author: Arnold C. Vermeulen

• A Correction for Truncation of Powder Diffraction Line Profiles
  Published in: European Powder Diffraction (p119)
• Assumptions in Thin Film Residual Stress Methods
  Published in: Residual Stresses VI, ECRS6 (p35)
• Data Collection Requirements for the Analysis of Residual Stress in Polycrystalline Coatings
  Published in: Residual Stresses VII, ECRS7 (p795)
• Determination of Alignment Errors in Classical XRD Residual Stress Methods
  Published in: Residual Stress ECRS 5 (p17)
• Fourier Methods for Separation of Size and Strain Broadening
  Published in: European Powder Diffraction (p77)
• Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
  Published in: European Powder Diffraction EPDIC 8 (p127)
• Peak Shift Correction for Transparency in Classical XRD Residual Stress Methods
  Published in: European Powder Diffraction EPDIC 7 (p166)
• The Sensitivity of Focusing, Parallel Beam and Mixed Optics to Alignment Errors in XRD Residual Stress Measurements
  Published in: Residual Stresses VII, ICRS7 (p131)