Papers by Author: B. Peplinski

Abstract: On the basis of data gathered in connection with a certification project, problems were investigated that impair the accuracy of quantitative phase analyses (QPA) using the Rietveld method. Some mechanisms were elucidated by which insufficient counting statistics of the diffraction data or inappropriate data handling and refinement strategy influence the QPA results.

Abstract: This paper outlines the standardisation process for the XRPD method that is currently being considered by a Working Group (WG10) of Technical Committee 138 "Non-destructive Testing" of the European Committee for Standardisation CEN. Several Standard Documents are on the verge of being released. These documents concern the general principles of (X-ray) diffraction, its terminology, and the basic procedures applied. Another document concerns the instruments used and it offers procedures to characterise and control the performance of an X-ray diffractometer properly. It is intended to issue Standard Documents on specific methods, e.g. determination of residual stresses. In fact work is in progress on this subject. The Standard Documents can be used by industry, government organisations, and research centres with activities related to safety, health and the environment, as well as for educational purposes.