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Articles by author: D. Ballutaud

• Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties
  Published in: Intergranular and Interphase Boundaries in Materials (p591)
• Copper Precipitation in Monocrystalline Silicon: Role of Initial Oxygen Concentration and Thermal Oxidation
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p353)
• Correlation between the Hydrogen Bonding Configurations in Amorphous Sputtered Silicon and the Crystallized Material Microstructure
  Published in: Polycrystalline Semiconductors IV (p187)
• Defect Microchemistry at the Si/SiO₂ Interface Grown on Polycrystalline Silicon Sheets. Hydrogenation Effect Study
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p539)
• Deuterium Effusion from Microcrystalline Sputtered Silicon Thin Films: Hydrogen Stability and Bonding Configurations
  Published in: Polycrystalline Semiconductors III (p373)
• Hydrogen Diffusion and Trapping in Microcrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p571)
• Hydrogen Effusion from Monocrystalline B-Doped Silicon
  Published in: Defects in Semiconductors 16 (p45)
• Incorporation and Interaction of Hydrogen with Acceptor Impurities in II-VI Semiconductor Compounds
  Published in: Defects in Semiconductors 17 (p447)
• Oxygen and Copper Precipitation at the Silicon/Silicon Dioxide Interface
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p191)
• Oxygen and Copper Precipitation in the Vicinity of the Silicon-Silicon-Dioxide Interface: Microstructure and Electrical Properties
  Published in: Polycrystalline Semiconductors III (p133)
• Simulation of Hydrogen Diffusion in n and p Type Silicon: Determination of Kinetic and Thermodynamic Parameters
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p253)
• Some Recent Advances on the n-Type Doping of Diamond
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p703)