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Articles by author: D.C. Jacobson

• Diffusion of Gold in Amorphous Silicon
  Published in: Defects in Semiconductors 16 (p203)
• Dopant Enhancement of the 1.54 µm Emission of Erbium Implanted in Silicon
  Published in: Defects in Semiconductors 16 (p653)
• Quantitative Measurements of Vacancy Defects in High-Energy Ion-Implanted Si
  Published in: Defects and Diffusion in Semiconductors IV (p177)
• The Effect of Implant Temperature and Pre-Annealing on Defect Formation after Laser Thermal Processing
  Published in: Defects and Diffusion in Semiconductors IV (p145)
• The Physics and Application of Si:Er for Light Emitting Diodes
  Published in: Defects in Semiconductors 17 (p707)