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CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: D. Stiévenard
18 papers on 2 pages:
1
[2]
[next]
A Model for the Atomic Configuration of the EL2 Defect in GaAs
Published in:
Defects in Semiconductors 14
(p305)
Accurate Determination of Capture Time Constant of Interface States in MOS Structures
Published in:
Defects in Semiconductors 14
(p499)
Characterization of Electron Traps in GaAs-GaAlAs Superlattices
Published in:
Defects in Semiconductors 14
(p199)
Defects in Heterostructures and Superlattices
Published in:
Defects in Semiconductors 15
(p679)
Detection of Defects Responsible for Lifetime in p-Type Si
Published in:
Defects in Semiconductors 17
(p189)
Electrical Characterization of Surface Defects on Porous p-Type Silicon
Published in:
Defects in Semiconductors 17
(p1475)
Electron Paramagnetic Resonance Studies of Intrinsic Defects in Electron-Irradiated GaAs
Published in:
Defect and Diffusion Forum Vols. 117-118
(p1)
Energy Levels Associated with the Metastable State of EL2
Published in:
Defects in Semiconductors 16
(p911)
Evidence for an Assisted Defect Mechanism Leading to a Reduced Apparent Band Offset
Published in:
Defects in Semiconductors 17
(p587)
Influence of Electron Irradiation Induced Defects on the Current-Voltage Characteristics of a Resonant Tunneling Diode
Published in:
Defects in Semiconductors 17
(p1553)
Intrinsic Defects in Electron Irradiated p-Type GaAs
Published in:
Defects in Semiconductors 16
(p965)
Irradiation Induced Defects in Semiconductors
Published in:
Materials under Irradiation
(p229)
Metastable to Stable EL2 Regeneration via an 'Auger' Mechanism Induced by the Debye Tail
Published in:
Defects in Semiconductors 15
(p85)
On the Behaviour of Hole Capture with Multiphonon Emission at Deep Level Defects H3 and H4 in p-GaAs
Published in:
Defects in Semiconductors 14
(p463)
Re-Examination of the Configuration Coordinate Diagram of EL2
Published in:
Defects in Semiconductors 16
(p917)
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