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Articles by author: Eddy Simoen

• A Deep Level Study of High-Temperature Electron-Irradiated n-Type Cz Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p367)
• Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p357)
• Buried Layer Processing for Advanced Bipolar Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p111)
• Carrier Lifetime Studies in Diode Structures on Si Substrates with and without Ge Doping
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p347)
• Characterisation of High-Energy Proton Irradiation Induced Recombination Centers in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p371)
• Co-Germanide Schottky Contacts on Ge
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p107)
• Comparison of Defects Created by Plasma-Based Ion Implantation and Conventional Implantation of Hydrogen in Germanium
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p101)
• Defect Analysis in Semiconductor Materials Based on p-n Junction Diode Characteristics
  Published in: Defects and Diffusion in Semiconductors - An Annual Retrospective IX (p1)
• Defect Engineering in Submicron CMOS Technologies
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p95)
• Defect Removal, Dopant Diffusion and Activation Issues in Ion-Implanted Shallow Junctions Fabricated in Crystalline Germanium Substrates
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p691)
• Degradation and their Recovery Behavior of Irradiated GaAlAs LEDs
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p119)
• DLTS of High-Resistivity Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p493)
• DLTS Study on Deep Levels Formed in Plasma Hydrogenated and Subsequently Annealed Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p547)
• Effect of Electron Irradiation on Thermal Donors in Oxygen-Doped High-Resistivity FZ Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p53)
• Effects of Lattice Defects on Degradation of Flash Memory Cell
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p231)