Papers by Author: Euripides Hatzikraniotis

Abstract: In this Work, Mg2si/MgO Nano-Composites Were Prepared by Co-Sputtering of Mg and Si Targets on Si {100} Substrates Using Dual Cathode Magnetron Sputtering. Films Were, Subsequently, Annealed at 380°C and 500°C for 4 Hours in Ar Gas Atmosphere. Various Mg/Si Sputtering Power Ratios Have Been Examined. Grown Films Were Characterized by XRD, SEM/EDS, and IR Reflectivity Measurements.

Abstract: We Report on the Structural and Vibrational Properties of the X = 0.11 and X = 0.33 Compositions of a New Class of Nanostructured Thermoelectric System (PbTe)1-X(PbSnS2)x by Means of X-Ray Diffraction, Scanning and Transmission Electron Microscopy and Infrared Reflectivity. both Compositions Are Phase Separated, where Pbsns2 Self-Segregates from Pbte to Form Features with Dimensions Ranging from Tens of Micrometers to Tens of Nanometers. Effective Medium Approximation Was Used in Order to Determine the Volume Fraction and the Dielectric Function of the Nanoscale Pbsns2 Embedded in Pbte. by Comparing the Phonon Parameters of the Nanoscale Pbsns2 and Bulk Pbsns2 Single Crystals, we Concluded that Phonon Confinement Effects and Bilayer Thickness Anisotropy within the Pbsns2 Nanostructures Embedded within Pbte Are Responsible for the Observed Variations in the Frequencies of the Shear and the Compression Modes Not Observed in Pure Crystals of Pbsns2.

Abstract: In this work, nano-crystalline Mg2Si powder was prepared by ball milling and structural studies vs ball milling time are presented. The identification of the phases of the materials and the evaluation of their purity were performed using Powder X-ray diffraction (PXRD). Crystallite size evolution during ball milling was followed by PXRD and single line analysis, based on Scherrer equation. Transmission Electron microscopy (TEM) observations and IR Reflectivity measurements were used for the investigation of nano-features and confirmation of the PXRD results.