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Papers by Author: G. Fritsch

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Structural Analysis and Residual Stress Measurements in a Natural Titanium Oxide Layer

Authors: M. Härting, G. Fritsch

343

Locally Resolved X-Ray Investigations by Means of X-Ray Optics

Authors: A. Krutzenbichler, J. Keimel, G. Fritsch

243

Non-Destructive Stress Measurement with Depth Resolution

Authors: M. Härting, G. Fritsch

159

Imaging the Focus of a Microfocus X-Ray Source with Zone Plates

Authors: A. Krutzenbichler, G. Fritsch

329