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Articles by author: George A. Rozgonyi

• Casting Single Crystal Silicon: Novel Defect Profiles from BP Solar's Mono^{2 TM} Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p1)
• Characterization of Nucleation Sites in Nitrogen Doped Czochralski Silicon by Density Functional Theory and Molecular Mechanics
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p99)
• Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p61)
• Defect Electrical Activity Study Using a Si(Ge) Heteroepitaxial Structure
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p309)
• Defect Engineering for Silicon-on-Insulator, MeV Implantation and Low Temperature Processing
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p183)
• Defect Engineering for ULSI Epitaxial Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p143)
• Defect Formation in Heavily As-Doped Cz Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p17)
• DRAM Wafer Qualification Issues: Oxide Integrity vs. D-Defects, Oxygen Precipitates and High Temperature Annealing
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p327)
• EBIC Study of Electrical Activity of Stacking Faults in Multicrystalline Sheet Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p627)
• Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p321)
• Electron Beam Induced Current Contrast of Oxygen Precipitation Related Defects in Czochralski Silicon
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p237)
• Electron Beam Induced Current Imaging of Silicon Oxide Damage Due to Reactive Ion Etching
  Published in: Polycrystalline Semiconductors IV (p359)
• Evaluation of Silicon Sheet Film Growth and Wafer Processing via Structural, Chemical and Electrical Diagnostics
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p211)
• Gettering at Vacancy and Interstitial-Rich Regions in MeV Ion Implanted Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p247)
• In-Situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p397)