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Articles by author: Hirotaka Ojima

• Design of Digital Filters for Si Wafer Surface Profile Measurement – Noise Reduction by Lifting Scheme Wavelet Transform
  Published in: Advances in Abrasive Technology XIII (p732)
• Development of CMG Wheels for Stress Relief in Si Wafer Thinning Process
  Published in: Advances in Abrasive Technology XIV (p678)
• Enhancement of Photocatalytic Reaction of Titanium Dioxide Film by Surface Texturing
  Published in: PRICM7 (p1784)
• Improvement in Oxide-Pattern Sizes Controllability on Scanning Probe Nanolithography
  Published in: Advances in Abrasive Technology XIII (p701)
• Influence of Surface Micro Texture on Photocatalitic Function of Titanium Dioxide Film
  Published in: THERMEC 2011 (p2646)
• Mold Fabricated by Nanoscratching for Nanoimprint Lithography
  Published in: Advances in Abrasive Technology XIII (p843)
• Spectroscopic Measurements of Silicon Wafer Thickness for Backgrinding Process
  Published in: Advances in Abrasive Technology XIV (p672)
• Study on Path Control Scheme by Laplacian Potential Field and Configuration Space for Vision Guided Micro Manipulation System
  Published in: Advances in Abrasive Technology XII (p725)