HomeJ. Wenzel

Papers by Author: J. Wenzel

Paper TitlePage

Quantitative Phase Analysis Using the Rietveld Method - Estimates of Possible Problems Based on Two Interlaboratory Comparisons

Authors: B. Peplinski, R. Kleeberg, J. Bergmann, J. Wenzel

Abstract: On the basis of data gathered in connection with a certification project, problems were investigated that impair the accuracy of quantitative phase analyses (QPA) using the Rietveld method. Some mechanisms were elucidated by which insufficient counting statistics of the diffraction data or inappropriate data handling and refinement strategy influence the QPA results.

Interlaboratory Comparison (Round Robin) of the Application of the Rietveld Method to Quantitative Phase Analysis by X-Ray and Neutron Diffraction

Authors: B. Peplinski, Dietrich Schultze, J. Wenzel

124

An X-Ray Powder Diffraction Investigation of a Fine-Grained Synthetic α-Cordierite Powder

Authors: B. Peplinski, Ralf Müller, J. Wenzel, R. Sojref, Dietrich Schultze

150

Proficiency Testing of Instruments - A Key Element for Quality Assurance in X-Ray Powder Diffraction Part 1: Matching the Effort to the Actual Needs

Authors: B. Peplinski, J. Wenzel

144

Phase Selective Chemical Analysis of Multi-Component Solids by X-Ray Powder Diffraction: On the Composition of α-Cordierit-Like Solid Solutions Crystallizing from Non-Stoichiometric Glasses

Authors: B. Peplinski, Wolfgang A. Schiller, J. Wenzel, Dietrich Schultze, I. Schiemann

578