Papers by Author: Jean Pierre Petit

Abstract: The electronic properties of chromia scales grown between 800°C and 900°C on chromium metal and chromia-forming ferritic stainless steels were determined using room temperature PhotoElectroChemistry (PEC) experiments and the relative importance of the n- and p-character of the scales could be assessed. According to the thermodynamic previsions of defects structures, the external part of all the scales grown in oxygen exhibits band gap energy around 3.5 eV, with a marked p-type character on chromium and a possibly n-type behaviour on stainless steels. On the contrary, the internal part of the scales is always n-type, with predominant interstitial chromium defects. A major change appears when chromium or stainless steels are oxidised in water vapour-argon mixtures, where the absence of a p‑type semiconductor in the scales could be evidenced. Hydrogen defects are thought to be responsible of this particular behaviour which leads to a strong reduction of residual stresses due to increased high temperature relaxation. Moreover, the inversion of the growth direction resulting from high mobility of the OH defects makes the chromia scales grown in water vapour more adherent than when grown in oxygen.

Abstract: Chromia scales grown on several chromia-forming metallic substrates in various conditions were characterised by photoelectrochemistry (PEC), highlighting the presence of two semiconductor phases signed by their respective bandgaps (3.0 and 3.5 eV) with variations of semiconduction type (n, p and insulator, more or less doped). The protective character of the scale was clearly demonstrated when the highest bandgap phase (3.5 eV), identified as the external subscale was close to an insulator.

Abstract: The oxidation of γ-Zr(Fe,Cr)2 intermetallic particles during the thermal exposition of Zircaloy-4 at 470°C in oxygen was investigated with PhotoElectroChemical techniques (PEC). Via the measurement of bandgap, haematite Fe2O3 (2.2 eV), rhomboedric solid solution (FexCr1-x)2O3 (2.6 eV) and chromia Cr2O3 (3.0 eV) phases were identified as components of oxidised particles. Evolution of size, lateral distribution and density of these particles was studied in function of zirconia scale thickness. During the first stage of oxidation, the density of oxidised particles increased with thickness but decreased during a second stage, highlighting in an innovative way the phenomenon of haematite and chromia dissolution in the zirconia matrix. It is concluded that PEC techniques represent a sensitive and powerful way to locally analyse the various semiconductor phases in an oxide scale at the micron scale.