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Articles by author: Jef Poortmans

• Bulk Passivation of Defects in Multi-Crystalline Silicon Solar Cells by a-SiN_x:H Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p357)
• EBIC Investigation of the Influence of Hydrogen Passivation on Thin-Film Polycrystalline Silicon Solar Cells Obtained by Aluminium Induced Crystallization and Epitaxy
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p413)
• Electrical Properties of SiGe Epitaxial Layers for Photovoltaic Application as Studied by Scanning Electron Microscopical Methods
  Published in: Beam Injection Assessment of Defects in Semiconductors (p509)
• Irradiation Induced Lattice Defects in Si_1-xGe_x Epitaxial Devices
  Published in: Defects in Semiconductors 18 (p371)
• Lattice Defects in Si_1-xGe_x Devices by Proton Irradiation and their Effect on Device Performance
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p239)
• Lattice Defects in Si_1-xGe_x Epitaxial Diodes Induced by 20-MeV Alpha Rays
  Published in: Defects in Semiconductors 19 (p121)
• Lattice Defects Induced in Si_1-xGe_x Diodes by 1-MeV Electron Irradiation and their Influence on Electrical Characteristics
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p247)
• Modern Technologies for Polycrystalline Silicon Solar Cells
  Published in: Polycrystalline Semiconductors IV (p461)
• Optimization of Post-Texturization Cleans for Heterojunction Solar Cells
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p341)
• Polysilicon Thin-Film Solar Cells: Influence of the Deposition Rate upon Enhanced Diffusion and on Cell Performance
  Published in: Polycrystalline Semiconductors VI (p269)
• Properties of p-n Diodes Made in Polysilicon Layers with Intermediate Grain Size
  Published in: Polycrystalline Semiconductors V (p577)
• Surface Passivation for Si Solar Cells: A Combination of Advanced Surface Cleaning and Thermal Atomic Layer Deposition of Al₂O₃
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p357)
• Three-Dimensional Emitter Based on Locally Enhanced Diffusion (TREBLE) Structure: Modeling and Formation
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p713)
• Two-In-One Texturing and Polishing in One Solution
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p353)
• UHV-VLPCVD Heteroepitaxial Growth of Thin SiGe-Layers on Si-Substrates: Influence of Pressure on Kinetics and on Surface-Morphology
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p361)