Papers by Author: Jing Lv

Abstract: Al films (about 40 nm) were prepared on quartz substrates by thermal evaporation technique, and subsequently annealed in air for 1h at temperature ranging from 600 to 1300oC. The characteristics of the annealed films were investigated in this paper. The measurement results of XRD and Raman show that crystalline phase transformations of the annealed films will convert from γ, γ and α, up to α-Al2O3 with the increasing of the annealing temperature at 600 oC, 1200 oC, to 1300oC. AFM and transmission spectra reveal the effects of phase transformations on their morphology and optical properties.

Abstract: Al films were prepared on quartz substrates by thermal evaporation. The effects of annealing in air on structure and optical and electrical properties have been studied. It is found that the annealing in air will affect on structure and morphology of the films, which results in the difference in the optical and electrical properties. The as-deposited film is amorphous, the films annealed at 200 and 400oC are polycrystalline. After annealed at 600oC, the film was oxidized and changed to porous γ-Al2O3. The film annealed at 200 oC has the maximum reflectance and at 400 oC has the minimum resistivity in all samples. While for the film annealed at 600 oC, the resistivity is close to be infinite, the reflectance is the minimum at wavelength ranging from 400 to 800 nm in all the samples.

Abstract: A series of Ag films with different thicknesses were prepared on polyethylene terephthalate (PET) substrates under identical conditions by thermal evaporation. The effect of the thickness on the optical and electrical properties of the films was studied. The morphology of the samples was investigated by atomic force microscopy (AFM). The optical and electrical properties were measured by spectrophotometer and four-point probe method, respectively. The experimental results show that the reflectance increases, while transmittance and resistivity decrease with the increase of the thickness. There exists a critical thickness of the film and it is 75 nm in this experiment. The optical and electrical properties of Ag films on PET substrates with thickness larger than critical thickness, are close to those of the conventional bulk silver. The resistivity of the 150-nm film is 3.0±0.2 μΩ•cm, which is lower than that of the 250-nm Ag film grown on BK-7 glass substrates.