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Articles by author: Jozef Keckes

• Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction
  Published in: Residual Stresses VI, ECRS6 (p697)
• Highly Oriented Layers of Hexaphenyl Thin Films for Application in Light Emitting Diodes
  Published in: European Powder Diffraction 6 (p1086)
• HPT-Deformation of Copper and Nickel Single Crystals
  Published in: Nanomaterials by Severe Plastic Deformation (p621)
• Position Resolved Residual Stress Determination in Alumina-Zirconia Multilayered Ceramics
  Published in: Stress Evaluation Using Neutrons and Synchrotron Radiation (p421)
• Small Angle X-Ray Scattering with Cobalt Radiation for Nanostructure Characterization of Fe-Based Specimen
  Published in: European Powder Diffraction EPDIC 8 (p155)
• Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin²ψ Methods
  Published in: Residual Stresses VII, ECRS7 (p711)
• Temperature Dependence of Residual Stress Gradients in Shot-Peened Steel Coated with CrN
  Published in: Stress Evaluation Using Neutrons and Synchrotron Radiation (p101)