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Articles by author: M. Onishi

• A Fast Shape Inversion Method of Flaws in Materials for Infrastructures
  Published in: Advances in Fracture and Failure Prevention (p981)
• Dopant Diffusion and Stacking Fault in Silicon during Thermal Oxidation
  Published in: Defects in Semiconductors 18 (p1631)
• Effect of Diffusion Barrier and Impurities in Titanium on the Growth Rate of TiAl₃ Layer
  Published in: Diffusion in Materials DIMAT 1996 (p591)
• Interdiffusion and Kirkendall Effect in Au-Zn Ordered β' Phase
  Published in: Diffusion in Materials - DIMAT 1992 (p629)
• Interfacial Reaction and Migration Due to Binary Reaction Diffusion
  Published in: Diffusion in Materials - DIMAT 1992 (p561)
• Measurement of the Kirkendall Marker Shift by the Parallel Inert Foil Method
  Published in: Diffusion in Metals and Alloys (p1281)
• Phase Boundary Migration Due to Interdiffusion
  Published in: Grain Growth in Polycrystalline Materials II (p215)