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Articles by author: Masanori Fujinami

• A Study of Defects in SiO₂ Films on Si by Variable-Energy Positron Annihilation Spectroscopy
  Published in: Positron Annihilation - ICPA-10 (p157)
• Decomposition of Doppler Broadened Annihilation Spectra
  Published in: Positron Annihilation - ICPA-11 (p793)
• Defect Studies in Semiconductors
  Published in: Positron Annihilation - ICPA-12 (p52)
• Defect Study on Si Implanted with B and BF₂ Ions by Coincidence Doppler Broadening Measurements
  Published in: Positron Annihilation - ICPA-12 (p469)
• Depth Dependence of Defects in Ion-Implanted Si Probed by a Positron Beam
  Published in: Positron Annihilation - ICPA-13 (p78)
• Observation of Positron Induced Ion Desorption
  Published in: Positron Annihilation - ICPA-13 (p370)
• Oxygen-Related Defects - Positron Interaction in Si
  Published in: Positron Annihilation - ICPA-11 (p218)
• Positron and Positronium in Free Volume in Oxides: Silica Glass and Neutron-Irradiated Alumina
  Published in: Positron Annihilation - ICPA-10 (p269)
• Positron Beam Study of Defects Induced in Ar-Implanted Si
  Published in: Positron Annihilation - ICPA-13 (p150)
• Positron Trapping Defects in Neutron-Irradiated Vitreous and Crystalline SiO₂
  Published in: Positron Annihilation - ICPA-11 (p460)
• 'Smart Cut' Silicon by Proton Implantation: Lifetime Studies with a Pulsed Positron Beam
  Published in: Positron Annihilation - ICPA-12 (p532)
• Study of Defect Behavior in Ion-Implanted Si Wafers by Slow Positron Annihilation Spectroscopy
  Published in: Defects in Semiconductors 18 (p1165)