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Papers by Author: Matthew D. Roth

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Simple Method for Mapping Optical Defects in Insulating Silicon Carbide Wafers

Authors: M. Mier, John Boeckl, Matthew D. Roth, Cengiz M. Balkas, M. Nelson

357

Photoluminescence and Thermally Stimulated Luminescence in Semi-Insulating SiC

Authors: Yu.M. Suleimanov, S. Lulu, I. Tarasov, Sergei S. Ostapenko, V.D. Heydemann, Matthew D. Roth, Olof Kordina, Mike F. MacMillan, Stephen E. Saddow

Reduction of Macrodefects in Bulk SiC Single Crystals

Authors: Cengiz M. Balkas, Andrei A. Maltsev, Matthew D. Roth, V.D. Heydemann, Mrityunjay Sharma, Nikolay K. Yushin

Resistivity Mapping of Semi-Insulating 6H-SiC Wafers

Authors: Matthew D. Roth, V.D. Heydemann, W.C. Mitchel, Nikolay K. Yushin, M. Sharma, Shao Ping Wang, Cengiz M. Balkas

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Role of Temperature Gradient in Bulk Crystal Growth of SiC

Authors: Cengiz M. Balkas, Andrei A. Maltsev, Matthew D. Roth, Nikolay K. Yushin

Deep Levels in SiC:V by High Temperature Transport Measurements

Authors: W.C. Mitchel, Ronald Perrin, Jonathan Goldstein, Matthew D. Roth, M. Ahoujja, S.R. Smith, A.O. Evwaraye, J.S. Solomon, G. Landis, Jason R. Jenny, H. McD. Hobgood, G. Augustine, Vijay Balakrishna

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