HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: Matthias Scheffler
9 papers on 1 page:
1
Calculated Thermodynamic Potentials for the Vacancy and the Oxygen A-Center in Silicon
Published in:
Defects in Semiconductors 15
(p625)
Chalcogen and Vacancy Pairs in Silicon: Electronic Structure and Stabilities
Published in:
Defects in Semiconductors 14
(p25)
Computation of Hyperfine Interactions for Substitutional Se
+
and S
+
Impurities in Silicon
Published in:
Defects in Semiconductors 15
(p293)
Defect Metastability in III-V Compounds
Published in:
Defects in Semiconductors 16
(p735)
Parameter-Free Calculations of the Pressure Dependence of Impurity Levels, Entropies and of Defect-Formation Volumes
Published in:
Defects in Semiconductors 15
(p299)
Pressure Dependences of Transition Energies of the As Antisite and the Ga-Vacancy-As-Interstitital Pair Compared to Stable and Metastable EL2
Published in:
Defects in Semiconductors 17
(p995)
Resonant Raman Scattering at Point Defects in GaAs
Published in:
Defects in Semiconductors 14
(p353)
The EL2 Defect in GaAs
Published in:
Defects in Semiconductors 15
(p51)
Theory of 4d Transition-Metal Ions in Silicon: Total-Energies, Diffusion, Electronic and Magnetic Properties
Published in:
Defects in Semiconductors 15
(p257)
Username:
Password: