HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Mikael Syväjärvi
68 papers on 5 pages:
1
[2]
[3]
...
[5]
[next]
Analysis of the Formation Conditions for Large Area Epitaxial Graphene on SiC Substrates
Published in:
Silicon Carbide and Related Materials 2009
(p565)
As-Grown 4H-SiC Epilayers with Magnetic Properties
Published in:
Silicon Carbide and Related Materials 2003
(p747)
Behavior of Micropipes during Growth in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2001
(p395)
Carrier Dynamics in Hetero- and Homo-Epitaxially Sublimation Grown 3C-SiC Layers
Published in:
Silicon Carbide and Related Materials 2010
(p161)
Characteristics of Boron in 4H-SiC Layers Produced by High-Temperature Techniques
Published in:
Silicon Carbide and Related Materials 2001
(p259)
Characteristics of Ni Schottky Contacts on Compensated 4H-SiC Layers
Published in:
Silicon Carbide and Related Materials - 2002
(p709)
Characteristics of Planar Defects in Shallow Trenches Related to the Presence of Micropipes
Published in:
Silicon Carbide and Related Materials - 2002
(p277)
Characterization of 4H-SiC MOS Structures with Al
2
O
3
as Gate Dielectric
Published in:
Silicon Carbide and Related Materials 2004
(p709)
Characterization of Anisotropic Step-bunching on as-grown SiC Surfaces
Published in:
Silicon Carbide and Related Materials - 1999
(p375)
Characterization of Electronic Properties of Different SiC Polytypes by All-Optical Means
Published in:
Silicon Carbide and Related Materials 2007
(p509)
Characterizations of SiC/SiO
2
Interface Quality Toward High Power MOSFETs Realization
Published in:
Silicon Carbide and Related Materials 2003
(p1281)
Considerations on the Crystal Morphology in the Sublimation Growth of SiC
Published in:
Silicon Carbide and Related Materials - 1999
(p95)
Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers
Published in:
Silicon Carbide and Related Materials 2006
(p327)
Domain Occurance in SiC Epitaxial Layers Grown by Sublimation
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p151)
Effect of Ambient on 4H-SiC Bulk Crystals Grown by Sublimation
Published in:
Silicon Carbide and Related Materials - 2002
(p75)
Username:
Password: