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Articles by author: N.A. Sobolev

• Capacitance Spectroscopy of Deep Centres in SiC
  Published in: Defects in Semiconductors 19 (p715)
• Defect Engineering in Erbium-Doped Silicon Structure Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p83)
• Defect Engineering in Si: Ho Light-Emitting Structure Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p371)
• Defect Engineering in the Technology of Light-Emitting Structures Based on Monocrystalline Si Implanted with Rare Earth Ions
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p645)
• Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p257)
• Defect Formation in MBE Er-Doped Si Light-Emitting Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p779)
• Defect-Impurity Interaction in Irradiated n-GaAs
  Published in: Defects in Semiconductors I (p51)
• Defects in NTD MCZ Si Doped with Magnesium
  Published in: Defects in Semiconductors 18 (p1153)
• Donor Centers in Er-Implanted Silicon
  Published in: Defects in Semiconductors 19 (p1515)
• Effect of Heat Treatment on Defect Formation in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p181)
• Electrically Active Centers in Silicon Doped with Erbium
  Published in: Defects in Semiconductors 18 (p615)
• Erbium in Silicon: Problems and Challenges
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p197)
• Fast Neutron Transmutation Reactions in Si - A New Way of Introduction of Mg-Related Centers
  Published in: Defects in Semiconductors 17 (p129)
• Impurity Centers Associated with Magnesium Introduced in Silicon by Fast Neutron Transmutation Reactions
  Published in: Defects in Semiconductors 18 (p163)
• Influence of Extended Structural Defects on the Characteristics of Electroluminescence in Efficient Silicon Light-Emitting Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p283)