HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: Nicolaas Stolwijk

• Fast Diffusion in Germanium and Silicon Investigated by Lamp-Based Rapid Thermal Annealing
  Published in: Rapid Thermal Processing and beyond: Applications in Semiconductor Processing (p35)
• Hybrid Impurity and Self-Diffusion in GaAs and Related Compounds: Recent Progress
  Published in: Diffusion in Materials DIMAT2000 (p687)
• Interstitial-Substitutional Diffusion in Group III-V and Group IV Semiconductors: The Role of Dislocations
  Published in: Diffusion Processes in High Technology Materials (p79)
• Iridium Diffusion into Silicon Wafers as a Means to Determine Silicon Vacancy Concentrations
  Published in: Diffusion in Materials - DIMAT2004 (p328)
• Measurements and Modeling of Zinc Diffusion Profiles in Gallium Phosphide
  Published in: Diffusion in Materials DIMAT2000 (p723)
• Modeling of Boron Diffusion in Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2000 (p327)
• Observation of Vacancies during Zn Diffusion in GaP
  Published in: Positron Annihilation - ICPA-13 (p26)
• Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si
  Published in: Defects in Semiconductors 17 (p675)
• Properties of Ga Self-Interstitials in GaAs Investigated by In-Diffusion of Cd
  Published in: Diffusion in Materials DIMAT 1996 (p1109)
• Segregation-Controlled Gold Diffusion in Polycrystalline Silicon
  Published in: Diffusion in Materials DIMAT 1996 (p1457)
• Synthesis of Amorphous Co-Nb Alloy Powders by Mechanical Alloying
  Published in: Diffusion in Metals and Alloys (p1343)
• Thermodynamic Properties of Self-Interstitials in Silicon: An Experimental Investigation
  Published in: Defects in Semiconductors 17 (p785)
• Titanium Self-Diffusion in the Intermetallic Compound γ-TiAl
  Published in: Diffusion in Materials - DIMAT 1992 (p865)
• Volume Diffusion of Gold in Polycrystalline Silicon
  Published in: Diffusion in Materials - DIMAT 1992 (p943)
• Zinc and Sulphur in Silicon: Experimental Evidence for Kick-Out Diffusion Behaviour
  Published in: Defects in Semiconductors 15 (p701)