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Papers by Author: R.X. Fischer

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The Effect of Divergence Slit Configuration, Background Handling and Texture Effects on Quantitative Analysis of Amorphous and Crystalline SiO₂-Fractions

Authors: B. Ruedinger, R.X. Fischer

169

PC-Rietveld Plus, A Comprehensive Rietveld Analysis Package for PC

Authors: R.X. Fischer, C. Lengauer, E. Tillmanns, R.J. Ensink, Céleste A. Reiss, E.J. Fantner

287

Ambiguities in the Interpretation of Powder Patterns

Authors: R.X. Fischer, E. Tillmanns

47