HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: Ryszard Buczko

• Alloy Broadening of the Acceptor-Related Near-Gap Luminescence in Semiconductor Alloys
  Published in: Shallow Impurities in Semiconductors V (p105)
• Atomic Structure and Properties of Extended Defects in Silicon
  Published in: Polycrystalline Semiconductors V (p3)
• Atomic-Scale Engineering of the SiC-SiO₂ Interface
  Published in: Silicon Carbide and Related Materials - 1999 (p1133)
• Electric Field Broadening of Gallium Acceptor States in Compensated Ge: Ga, As
  Published in: Defects in Semiconductors 18 (p127)
• Si/SiO₂ and SiC/SiO₂ Interfaces for MOSFETs – Challenges and Advances
  Published in: Silicon Carbide and Related Materials 2005 (p935)
• Spherical Model of Shallow Acceptor Resonant P_1/2 States in Cubic Semiconductors
  Published in: Shallow Impurities in Semiconductors V (p93)
• Test for the Impurity Wavefunction Modelling from the Alloy Broadening of the Impurity-Related Luminescence
  Published in: Defects in Semiconductors 17 (p501)