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Articles by author: Simona Kouteva-Arguirova

• Characterization of Thin Film Photovoltaic Material Using Photoluminescence and Raman Spectroscopy
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p419)
• Hafnium Oxide on Silicon: A Non-Destructive Characterization of the Interfacial Layer
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p653)
• Residual Stress Distribution and Silicon Phase Transformation Induced by Rockwell Indentation at Different Temperatures, Studied by Means of Micro-Raman Spectroscopy
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p513)
• Self-Assembled Surface Patterning and Structural Modification upon Femtosecond Laser Processing of Crystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p635)