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Articles by author: T.E.M. Staab

• Calculated Positron Annihilation Parameters for Defects in SiC
  Published in: Silicon Carbide and Related Materials 2000 (p533)
• Detailed Microscopic Defect Identification in GaAs
  Published in: Positron Annihilation - ICPA-12 (p76)
• Irradiation Experiment Revisited – Stability and Positron Lifetime of Large Vacancy Clusters in Silicon
  Published in: Positron Annihilation - ICPA-12 (p135)
• Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
  Published in: Positron Annihilation - ICPA-13 (p498)
• Observation of Vacancies during Zn Diffusion in GaP
  Published in: Positron Annihilation - ICPA-13 (p26)
• Open-Volume Defects in Plastically Deformed Semiconductors
  Published in: Positron Annihilation - ICPA-12 (p61)
• Positron Annihilation in Fine Powders and Fine-Grained Materials
  Published in: Positron Annihilation - ICPA-11 (p479)
• Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
  Published in: Positron Annihilation - ICPA-13 (p510)