Authors: Jörn Donges, André Rothkirch, Thomas Wroblewski, Aniouar Bjeoumikhov, Oliver Scharf, Ivan Ordavo, Sebastian Ihle
Abstract: Position resolved structural information from polycrystalline materials is usually obtained via micro beam techniques illuminating only a single spot of the specimen. Multiplexing in reciprocal space is achieved either by the use of an area detector or an energy dispersive device. Alternatively spatial information may be obtained simultaneously from a large part of the sample by using an array of parallel collimators between the sample and a position sensitive detector which suppresses crossfire of radiation scattered at different positions in the sample. With the introduction of an X-ray camera based on an energy resolving area detector (pnCCD) we could combine this with multiplexing in reciprocal space.
21
Authors: Katja Kroschewski, Adam Webb, Thomas Wroblewski, Karsten Wurr
Abstract: The outstanding properties of synchrotron radiation (SR) allow manifold investigations of materials and processes which are not possible with conventional X-ray sources. Its high brightness allows extremely precise or time/spatial resolved measurements. In combination with its high collimation extremely high angular resolution is achievable. The white spectrum of SR allows tuning of the wavelength for spectroscopic applications or optimization according to the requirements of the experiment.
2493
Authors: Thomas Wroblewski, Adeline Buffet
Abstract: X-ray diffraction imaging allows the investigation of a large area of a polycrystalline
specimen in a single shot. Dynamic processes like recystallization can, therefore, be studied without
prior knowledge of where they occur. Even early stages of nucleation can be traced back using the
information from images taken from the fully recrystallized specimen. Experiments performed at
HASYLAB beamline G3 on cold rolled Cu and Al showed nucleation and growth behaviour that
cannot be explained by classical models.
631
Authors: Claudia Juricic, Haroldo Pinto, Thomas Wroblewski, Anke Pyzalla
Abstract: Mass gain during oxidation, texture and residual stresses in oxide layers on
polycrystalline Armco iron substrates with different surface conditions are investigated using
thermogravimetry microscopy and synchrotron X-rays. The mass gain during oxidation in all
samples follows a parabolic law. The parabolic oxidation constant increases with increasing
roughness of a mechanically ground respectively polished oxide layer. Electrolytic polishing (grain
surface etching) reduces while grain boundary etching increases the parabolic oxidation constant
compared to the mechanically polished sample. All oxide layers show columnar growth of the
magnetite and a moderate fiber texture. The magnetite contains compressive residual stresses.
Under the conditions chosen for the oxidation treatment the magnitude of these compressive
residual stresses does not depend on the substrate surface condition.
963
Authors: H.A. Crostack, Ursula Selvadurai-Lassl, Wolfgang Tillmann, Miriam Gathen, Christian Kronholz, Thomas Wroblewski, André Rothkirch
Abstract: Manufacturing diamond-cobalt composites by sintering results in residual stresses due to
the mismatch of thermal expansion coefficients mainly. To understand the influence of
manufacturing process parameters on residual stresses of sintered diamond-cobalt composites
samples are produced by different process parameters. The investigated diamond composites are
pressureless sintered as well as pressureless sintered combined with hot isostatically pressing. Here
the influence of powder characteristics and process parameters like compaction pressure and
sintering temperature on the residual stresses and microstructure was analysed by X-ray diffraction,
microscopy and tomography. The aim of this study is to correlate residual stresses with
manufacturing parameters and to give hints for optimising the residual stress state and for
improving the lifetime of diamond-cobalt composites.
787
Authors: Thomas Wroblewski, A. Bjeoumikhov, Bernd Hasse
Abstract: X-ray diffraction imaging applies an array of parallel capillaries in front of a position
sensitive detector. Conventional micro channel plates of a few millimetre thickness have
successfully been used as collimator arrays but require short sample to detector distances to achieve
high spatial resolution. Furthermore, their limited absorption restricts their applications to low
energy X-rays of around 10 keV. Progress in the fabrication of long polycapillaries allows an
increase in the sample to detector distance without decreasing resolution and the use of high X-ray
energies enables bulk investigations in transmission geometry.
273
Authors: B. Kasanická, Thomas Wroblewski, Volker Schulze, Detlef Löhe
Abstract: Analysis of the residual stress state, the microstructure and surface topography of
ceramic microcomponents made of Y2O3-stabilized ZrO2 produced by micro powder injection moulding were performed. During the production of the microspecimens sintering conditions were varied. The measurement of residual stresses has been carried out using the MAXIM (MAterials XRay IMaging) diffractometer at HASYLAB beamline G3 at DESY in Hamburg (Germany). The
microstructure and surface topography of differently moulded specimens were examined using a scanning electron microscope (SEM) and a confocal white light microscope type NANOFOCUS. The findings are used to establish correlations between process parameters and characteristics of the microcomponents. These will allow to improve the production process with respect to the mechanical properties of the microcomponents.
503
Authors: Thomas Wroblewski
Abstract: A novel X-ray diffraction method, allowing the position resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality.
689
Authors: Thomas Wroblewski
121
Authors: F. Eberle, Thomas Wroblewski, Georges Cailletaud, Jean Lu Lebrun
60